Work

Power-Clamp-Triggered SCR for Broadband RF ESD Protection

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3617031

Authors: Hao-En Cheng, Chun-Yu Lin

Institutions: National Taiwan Normal University, National Yang Ming Chiao Tung University

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science and Technology Council

Award: G2531645528

OpenAlex ID: W4415180839

FWCI: 1.155

Cites: 14

Cited by: 5

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