Work

High-speed infrared spectroscopic polarization measurement method using a mid-IR monolithic polarizing interferometric module

Year: 2025

Type: article

Abstract: This paper describes a high-speed infrared spectroscopic polarization measurement method combining a mid-IR monolithic polarizing interferometric module with an FT-IR spectrometer. The proposed mid-IR polarization measurement system features no rotating components in polarization modulation, enabling us to extract spectroscopic ellipsometric parameters with a measurement speed of a few seconds in the mid-IR range. The proposed system can provide a much faster mid-IR range polarization measurement capability than currently available commercial IR spectroscopic ellipsometer systems. In this study, detailed theoretical background and experiments are conducted to demonstrate the feasibility and performance of the proposed method.

Source: Micro & Nano Manufacturing

DOI: 10.1007/s44374-025-00004-7

Authors: Jayakumar Paul Madhan, Cheongsong Kim, Sukhyun Choi, Saeid Kheiryzadehkhanghah, Gukhyeon Hwang, Daesuk Kim

Institution: Jeonbuk National University

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $1,890

Funders: National Research Foundation, Ministry of Trade, Industry and Energy, National Research Foundation of Korea, Korea Evaluation Institute of Industrial Technology