Adaptive Remaining Useful Life Prediction for Film Capacitors in DC-Link Applications Using Degradation and Failure Data
Year: 2025
Type: article
Authors: Jian Gao, Shaowei Chen, Da Wang, Huai Wang, Shuai Zhao
Institutions: Northwestern Polytechnical University, Aalborg University
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4415222151