A Suspended 4H-Silicon Carbide Membrane Platform for Defect Integration into Quantum Devices
Year: 2025
Type: article
Source: Nano Letters
Authors: Amberly H. Xie, Aaron M. Day, Jonathan R. Dietz, Chang Jin, Chaoshen Zhang, Eliana Mann, Zhujing Xu, Marko Loncar, Evelyn L. Hu
Institution: Harvard University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Amazon Web Services
OpenAlex ID: W4415224611