Work

Investigation on the Interference of Floating Charge With the Effectiveness of ESD Bus-Based Clamp Network

Year: 2025

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2025.3616291

Authors: Longhua Lin, Feibo Du, Xiaoyu Dong, Ruibo Chen, Fei Hou, Dongxing Gao, Shupeng Chen, Xuyao Wang, Zhiwei Liu

Institutions: Xidian University, Shenzhen Technology University, University of Electronic Science and Technology of China

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415250720

FWCI: 0.231

Cites: 12

Cited by: 1

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