Integrated Hardware and Algorithmic Decoupling of Light-Noise-Attenuation Coupled Errors: A Path to 50 Pa Precision in Micro-Pressure PSP Measurements
Year: 2025
Type: article
Abstract: In low-speed flow (Ma < 0.3), pressure-sensitive paint (PSP) technology encounters a significant bottleneck in micro-pressure measurements due to the coupled interference of light source instability, camera noise, and paint photodegradation. This study introduces a hardware–algorithm collaborative decoupling framework to address the light noise–degradation coupling issue. The framework integrates real-time light source fluctuation monitoring using a photomultiplier tube (PMT), a combined histogram–wavelet denoising algorithm, and a dynamic photodegradation compensation model. A high-precision static calibration system with a pressure control error of 3.4 Pa was constructed to validate the proposed framework. The experimental results indicate that light source fluctuations contribute an error of 42.61 Pa, accounting for 33% of the total error. After collaborative optimization, the PSP measurement error was reduced to below 50 Pa, representing a 50% improvement compared to previous results (100 Pa). This study provides reliable technical support for micro-pressure measurement applications, such as low-speed wind tunnel testing of aerospace vehicles and microfluidic diagnostics.
Source: Aerospace
Authors: Kun Cao, Qiang Liu, Chunhua Wei, Yunmao Bai, Lei Liang
Institution: China Aerodynamics Research and Development Center
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,896
Award: G3402645474
OpenAlex ID: W4415294890