Reliability Analysis of a Microinverter Prototype: A Case Study on Sn-Ag-Cu Solder Under Thermal Fatigue for Encapsulated GaN Packages
Year: 2025
Type: article
Source: Journal of Electronic Packaging
DOI: 10.1115/1.4070161
Institution: University of Maryland, College Park
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G8767628775
OpenAlex ID: W4415321647
