Intelligent Solutions to Processor Error Rates: AI-Driven Diagnostics and Parallel Architecture Design
Year: 2025
Type: article
Abstract: The study focuses on the high error rates in modern electronic devices due to algorithmic issues, interference, and structural defects. It uses questionnaires, interviews, and data analysis to investigate causes and strategies for mitigating processor failures. Key discoveries include artificial intelligence for error correction, multi-core processing methods, and improved calculations. The report recommends developing accurate testing programs, improving collaboration, improving algorithms, and designing parallel processors.
Source: Alqalam Journal of Science
DOI: 10.69667/ajs.25304
Author: Omar Ahmad
Language: English
Subfield: Hardware and Architecture
Field: Computer Science
Domain: Physical Sciences
Open Access status: hybrid
OpenAlex ID: W4415338332
FWCI:
Cites:
Cited by:
Related to: