Work

Investigation of degradation mechanisms and post-annealing effects in polymer field-effect transistors under x-ray irradiation

Year: 2025

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0276957

Authors: Hong Zhu, Lijian Chen, Quanhua Chen, Haotian Wu, Zhihao Yu, Huabin Sun, Yong Xu, Jinshun Bi, Guangan Yang

Institutions: Nanjing University of Posts and Telecommunications, Guizhou Normal University, Guangdong Greater Bay Area Institute of Integrated Circuit and System

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Awards: G3937354820, G4102864899, G7801479901, G782379324, G7891168055

OpenAlex ID: W4415357538

FWCI: 0.227

Cites: 27

Cited by: 1

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