Numerical ellipsometry: Advanced methods for design, testing, and use of artificial intelligence for absorbing films using Jones and/or Mueller measurements
Year: 2025
Type: article
DOI: 10.1116/6.0004875
Authors: F. K. Urban, D. Barton
Institution: Florida International University
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Florida International University
OpenAlex ID: W4415358200