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Few-Shot Learning-Based Analysis of Production Areas Using Large Foundation Models and Metric Learning

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)

DOI: 10.1109/etfa65518.2025.11205546

Authors: Johannes C. Bauer, Johanna Dechent, Stephan Trattnig, Paul Geng, Sonja Wächter, Rüdiger Daub

Institution: Technical University of Munich

Language: English

Topic: Domain Adaptation and Few-Shot Learning

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4415398816

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