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Unsupervised Defect Clustering From Optical One-Class Anomaly Detection

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)

DOI: 10.1109/etfa65518.2025.11205633

Authors: Martin Pape, Defne Milen Gueler, Ferdinand Waßelewsky, Tom Wolf

Institution: Fraunhofer Institute for Production Systems and Design Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4415400236

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