Revealing anisotropic lithiation control in silicon nanowires via a novel in situ TEM-based cross-sectional characterization method
Year: 2025
Type: article
Source: Nanoscale Horizons
DOI: 10.1039/d5nh00486a
Institution: Southeast University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4415401586
