Work

Analyze Distortion in Plane-symmetric Spectrometers Using Analytical Aberration Theory

Year: 2025

Type: conference-paper

Source: Optical Design and Fabrication Congress

DOI: 10.1364/freeform.2025.frtu3a.2

Authors: Yuxuan Liu, Jannick P. Rolland

Institution: University of Rochester

Language: English

Topic: Advanced optical system design

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415590015

FWCI:

Cites: 1

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Related to: 10