Work

Real-time Evaluation of SEE Susceptibility and Breakdown Mechanisms in SiC MOSFETs under High-energy Proton Irradiation

Year: 2025

Type: article

Source: Journal of the Institute of Electronics and Information Engineers

DOI: 10.5573/ieie.2025.62.10.22

Authors: Gyu-Ho Choi, Seong-Yoon Woo, Kibeom Kim, Young-Jun Yoon, Jae-Hwa Seo

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415601083

FWCI:

Cites:

Cited by:

Related to: