Low-temperature electron dephasing rates indicate magnetic disorder in superconducting TiN films
Year: 2025
Type: article
Abstract: We investigate electron transport and phase-breaking processes in thin titanium nitride (TiN) films of epitaxial quality. Previous studies show that a minute surface magnetic disorder significantly reduces the critical temperature (Tc) and broadens the superconducting transition as the film thickness and device size decrease. We measure electron dephasing rates via magnetoresistance from Tc to ∼4Tc in various-thickness TiN films. Electron dephasing occurs on the picosecond timescale and is nearly independent of temperature, differing from the expected inelastic scattering due to the electron–phonon and electron–electron interactions near Tc, which occur over a nanosecond timescale. We propose spin-flip scattering as a possible additional phase-breaking mechanism. The significant increase in the dephasing rate for the thinnest film indicates that magnetic disorder resides near the surface of naturally oxidized films. Our research suggests that magnetic disorder may be a significant contributor to RF dissipation in superconducting devices based on TiN.
Source: Applied Physics Letters
DOI: 10.1063/5.0286394
Institutions: National University of Science and Technology, National Research University Higher School of Economics, Moscow State Pedagogical University, Moscow Power Engineering Institute, Skolkovo Institute of Science and Technology, Argonne National Laboratory, University of Illinois Urbana-Champaign
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
Funder: Russian Science Foundation
Award: G2024017070
OpenAlex ID: W4415617870
