Work

Modeling and Investigation of Auto Focus Disparity Sensitivity for CMOS Image Sensors with Sub-Micrometer Scale Pixel Size

Year: 2025

Type: conference-paper

Source: International Conference on Simulation of Semiconductor Processes and Devices

DOI: 10.1109/sispad66650.2025.11186357

Authors: Euiyoung Song, Jae Ho Kim, Kwanghee Lee, Jongsu Yoon, Sungchul Kim, Dongun Shin, Seunghyun Hong, Sung-Su Kim, Yonghee Park, Dae Sin Kim

Institutions: Samsung (South Korea), Samsung Electronics (South Korea)

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415625014

FWCI:

Cites: 3

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Related to: 10