High‐Quality Ceramic Polycrystalline Wafers Fabricated by High‐Temperature Sintering for Sensitive and Ultrastable X‐Ray Detection
Year: 2025
Type: article
Source: Advanced Optical Materials
Authors: Ji Yu, Chengyuan Wang, Guannan Li, Ruoning Zheng, Yinxian Luo, Zhou Yang, Ning Tian, Lin Li, Yi Xu, Jiangxin Pan, Shengzhong (Frank) Liu
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
Award: G4381488211
OpenAlex ID: W4415729440
