Work

A Mechanical–Electrical Damage Model for Performance Analysis of Crack-based Strain Sensor

Year: 2025

Type: article

Source: International Journal of Applied Mechanics

DOI: 10.1142/s1758825125501248

Authors: Quan Sun, Shupeng Wei, Islambek Saymanov, Yebo Lu, Wenbin Deng, Junbin Lou

Institutions: Jiaxing University, Zhejiang Sci-Tech University, New Uzbekistan University, National University of Uzbekistan

Language: English

Topic: Advanced Sensor and Energy Harvesting Materials

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Science and Technology Bureau of Jiaxing City

Awards: G2577993911, G6251207921, G9977171

OpenAlex ID: W4415730834

FWCI: 0.237

Cites: 31

Cited by: 1

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