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Edge AI Dependability: Is Bit-flip Direction the Right Concern in Trustworthiness Reinforcement?

Year: 2025

Type: conference-paper

DOI: 10.1109/sbcci66862.2025.11218684

Authors: Régis Leveugle, Ahmed Al Kaf, Mounir Benabdenbi

Institutions: Institut polytechnique de Grenoble, Centre National de la Recherche Scientifique, Techniques of Informatics and Microelectronics for Integrated Systems Architecture, Université Grenoble Alpes

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415744257

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Cites: 18

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