Work

Critical Analysis of Intersection-Point-Based Techniques for the Experimental Indirect Determination of Thermal Resistance in Bipolar Transistors

Year: 2025

Type: conference-paper

Source: International Workshop on Thermal Investigations of ICs and Systems

DOI: 10.1109/therminic65879.2025.11216907

Authors: Vincenzo d'Alessandro, Ciro Scognamillo, Antonio Pio Catalano, Lorenzo Codecasa

Institutions: University of Naples Federico II, Politecnico di Milano

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4415822206

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Cites: 16

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