Work

Prediction of single event effects in SiC MOSFET devices based on deep learning

Year: 2025

Type: article

Source: Nanotechnology

DOI: 10.1088/1361-6528/ae1a8f

Authors: Yixian Guo, Yingqi Chen, Xiaozhi Du, Shuhuan Liu, Qian Wang

Institutions: Xi'an Jiaotong University, China Institute of Atomic Energy

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G826070041

OpenAlex ID: W4415827743

FWCI: 0.227

Cites: 25

Cited by: 1

Related to: