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Reliability Analysis Method of Low‐Voltage Circuit Breakers Based on the Key Failure Modes

Year: 2025

Type: article

Source: IEEJ Transactions on Electrical and Electronic Engineering

DOI: 10.1002/tee.70204

Authors: Bokai Hu, Chengchen Zhao, Kui Li, Yao Wang, Shihu Xiang, Shaopo Huang

Institutions: Hebei University of Technology, Tianjin Agricultural University, Beijing Institute of Petrochemical Technology

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4415835364

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Cites: 13

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