Physics-based compact model for 2D TMD FETs with full-range validation from single device to circuit
Year: 2025
Type: article
Source: Nanoscale Horizons
DOI: 10.1039/d5nh00341e
Authors: Dokyoung Lee, Jeongyun Jang, Jimin Han, Sae Rim Kim, Jiwon Baik, Hayoung Roh, Sungho Kim
Institution: Ewha Womans University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
Awards: G2588694139, G809632853
OpenAlex ID: W4415913295
