Work

Decoding Surface-Bound Isomers: A QIT-ToF-SIMS Platform Integrating Tandem Mass Spectrometry and Laser Spectroscopy

Year: 2025

Type: article

Abstract: A quadrupole-ion-trap-integrated time-of-flight secondary ion mass spectrometry (QIT-ToF-SIMS) system was developed to enable detailed molecular surface analysis via tandem mass spectrometry combined with laser photodissociation spectroscopy. In this approach, secondary molecular ions were selectively isolated in the ion trap using the stored waveform inverse Fourier-transform technique and subsequently subjected to collision-induced dissociation or photoinduced dissociation. Using isomeric rhodamine dyes as model systems, structurally diagnostic fragment ions were observed, allowing for clear molecular identification despite identical nominal masses. The laser photodissociation spectra obtained for the isolated ions revealed a distinct wavelength-dependent fragmentation behavior, consistent with known gas-phase absorption profiles. Because of the integration of tandem mass spectrometry and laser spectroscopy with time-of-flight secondary ion mass spectrometry, the QIT-ToF-SIMS system serves as an effective tool for molecular-level surface characterization, which is particularly well suited for probing increasingly complex organic materials and interfaces.

Source: Analytical Chemistry

DOI: 10.1021/acs.analchem.5c05564

Authors: Ji Young Baek, Jae Yeong Eo, Eombae Moon, Myoung Choul Choi, Chang Min Choi

Institution: Korea Basic Science Institute

Language: English

Topic: Mass Spectrometry Techniques and Applications

Subfield: Spectroscopy

Field: Chemistry

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $4,500

Funders: Korea Basic Science Institute, National Research Foundation of Korea