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Advancing MOSFET Fault Type Detection Through Data-Driven Unsupervised Learning

Year: 2025

Type: conference-paper

Source: Proceedings of the Annual Conference of the IEEE Industrial Electronics Society

DOI: 10.1109/iecon58223.2025.11221883

Authors: Abdallah Alfaham, Murat Kocak, Furkan Elmaz, Jerome Mitard, Joris Vanderschrick, Kevin Mets, Siegfried Mercelis

Institutions: University of Antwerp, IMEC, KU Leuven

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4415970202

FWCI:

Cites: 12

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