Work

Dielectrics and capacitors at cryogenic temperature revealed by synchrotron cryo-X-ray microtomography

Year: 2025

Type: article

Abstract: The functionality/reliability of electronic devices in extreme low temperatures are limited. Therefore, understanding their characteristics at low temperature is important for optimizing the performance/design of individual electronic components. Capacitors are one such electronic components sensitive to temperature. Conventional low temperature electrical characterization lack spatial information. Here we combine synchrotron-cryo-microtomography, finite element modeling, and electrical characterization, to correlate the electrical and microstructural properties within capacitors down to -197 °C. Our experiments reveal that a change in capacitance at low temperature is due to micro-structural changes in the dielectrics, seen as change in cracks opening/closing. We find that the macroscopic/microscopic structural changes are induced by local thermal contraction, and these are stronger with multiple interfacing materials, affecting their electrical characteristics. Our results show new insights towards the functionality of commercial capacitors at low temperatures and provide an important benchmark for developing and designing future capacitors for extreme environmental conditions.

Source: Journal of the European Ceramic Society

DOI: 10.1016/j.jeurceramsoc.2025.117966

Authors: Jaianth Vijayakumar, Yves Watier, Paul Thompson, Sofiane Guessasma, Paul Tafforeau

Institutions: European Synchrotron Radiation Facility, University of Liverpool, Institut National de Recherche pour l'Agriculture, l'Alimentation et l'Environnement, Biopolymères Interactions Assemblages

Language: English

Topic: Dielectric properties of ceramics

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: hybrid

Estimated APC paid: $3,900

Funder: Engineering and Physical Sciences Research Council