Author response for "Chemical Defects as Li + Ion Traps: A Theoretical Study"
Year: 2025
Type: peer-review
Source: Publons reviews and discussion
Authors: DongYoon Shin, Jacek Klos, Jacob Fortner, Yuhuang Wang
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4416014614