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Smart Factory Product Defect Detection Using Deep Learning

Year: 2025

Type: conference-paper

Source: Lecture notes in mechanical engineering

DOI: 10.1007/978-981-95-0063-5_34

Authors: Deo Prakash, Arya Singh, Yash Deep Singh Bais, Vasihnavi Majumdar, Eshani Patel, Om Prakash Sahu

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4416098957

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Cites: 1

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