On the thickness-driven metal–insulator transitions of buried LaNiO3 films
Year: 2025
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0289069
Authors: Yujie Zhou, Xiaoyu Qiu, Jie Tu, Yingjia Li, Xiang Xu, Zijian Chen, Chen Zhou, Zhao Guan, Yonghui Zheng, Ni Zhong, Pinghua Xiang, Binbin Chen
Institution: East China Normal University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4416112815