Work

Dendritic microstructures observed in electron-beam deposited hafnia films

Year: 2025

Type: article

Abstract: Dendritic microstructures inside hafnia dielectric coatings fabricated via electron-beam deposition are investigated. These structures are observable with different optical characterization tools, including atomic force microscopy, fluorescence microscopy, Raman microscopy, and differential interference contrast microscopy. Long-term monitoring of individual samples over a seven-year time span revealed that the dendrite-like structures evolve over time, while the hafnia material in the dendrite structure—as compared to the rest of the coating—shows a decrease in crystallinity and an increase in defect density.

Source: Optical Materials Express

DOI: 10.1364/ome.577167

Authors: B. N. Hoffman, M. Mireles, T. Z. Kosc, S. G. Demos

Institution: University of Rochester

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: gold

Estimated APC paid: $1,843

Funder: National Nuclear Security Administration