Work

Design and Test of a 3-Terminal Work-Function Engineered Universal Gate and Modelling of Its Static Performance Metrics

Year: 2025

Type: article

Source: Semiconductors

DOI: 10.1134/s1063782625602547

Authors: Arun Kumar Sinha, Sri Lakshmi Sangam

Institution: VIT-AP University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4416131963

FWCI:

Cites: 22

Cited by:

Related to: