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Comparative Study on Microwave Diagnostics: Cutoff Probe, Hairpin Probe, and Microwave Interferometer

Year: 2025

Type: conference-paper

Abstract: International audience

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Kim, S., Booth, Jean-Paul, Curley, Garrett

Institution: Laboratoire de Physique des Plasmas

Language: English

Topic: Plasma Diagnostics and Applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4416167052

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