Work

Astigmatic Displacement Microscopy (ADM) with Subnanometer Axial Resolution for Three-Dimensional (3D) Morphological Characterization

Year: 2025

Type: article

Source: Analytical Chemistry

DOI: 10.1021/acs.analchem.5c04988

Authors: Dou-Dou Ren, Fei-Cen Ma, Rui-Lin Yang, Dan Zhou, Bi-Qin Zhang, Hui-Qin Zhou, Xiao He, Jiang-Hua Zhang, Wei-Bing Wang, Yihua Shang, Heng-Hua Li, Xiao-Chen Dang, Chun-Lin Sun, Haijun Zhang, Yuewen Zhang, Qiaosheng Pu, Zhi-Cong Zeng

Institution: Lanzhou University

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Fundamental Research Funds for the Central Universities

Awards: G1858713179, 基于光学像散原理的具备单原子台阶分辨的光学显微镜研制及其在原位电化学界面研究的应用, G2172127719, G5953915929, G8488986037

OpenAlex ID: W4416224628

FWCI: 0.362

Cites: 26

Cited by: 1

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