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A Multiport Transistor Characterisation Technique Including Mutual Inductances Using 2-Port VNA

Year: 2025

Type: conference-paper

Source: International Symposium on Power Electronics (Ee)

DOI: 10.1109/ee67693.2025.11227091

Authors: Kacper Kołodziej, Stéphane Baffreau, Paul-Etienne Vidal, Bruno Allard

Institutions: Lyon 1 Université, École Centrale de Lyon, Institut National des Sciences Appliquées de Lyon, Laboratoire Génie de Production, Université de Toulouse

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4416233570

FWCI:

Cites: 7

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