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In-Situ Calibration with Silicon-Based Noise Diode for Enhanced Industrial RF Testing

Year: 2025

Type: conference-paper

Source: European Microwave Conference (EuMC)

DOI: 10.23919/eumc65286.2025.11235243

Authors: Samuel Nguyen Dinh An, Cybelle Belem Goncalves, Victor Fiorese, Daniel Gloria, Federico Alimenti, Giacomo Schiavolini, Guillaume Ducournau, Joao Carlos Azevedo Goncalves

Institutions: Institut d'Electronique, de Microélectronique et de Nanotechnologie, STMicroelectronics (France), University of Perugia

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4416367135

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Cites: 13

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