Work

Benchmarking of new approach for analyzing transverse beam emittance measurement

Year: 2025
Type: conference-paper
Abstract: A recent analysis of emittance measurements highlighted the limited reliability of tools for precise method evaluation and error calculations. In this paper, a new analysis method is presented with its associated errors calculations. It is evaluated using realistic beam simulations and compared to the linear regression method commonly referenced in the literature. This new analysis method is shown to be easier to implement and provides results with a good confidence interval.
Language: English
Open Access status: green
OpenAlex ID: W4416554702
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