Work

Accurate thickness characterization of materials via wavelet denoising and baseline correction at the terahertz frequency

Year: 2025

Type: article

Source: Applied Optics

DOI: 10.1364/ao.579027

Authors: Li Wang, Dayou Liu, Juncheng Bao, Feng Qi

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

Award: G4613745495

OpenAlex ID: W4416578243

FWCI:

Cites: 21

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