Aging Mechanism Analysis for Series‐Connected Battery Pack Based on Open‐Circuit Voltage Reconstruction under Low Temperature
Year: 2025
Type: article
Source: Energy Technology
Authors: Wenhua Li, Tian Hu, Chunxiang Zhang, Jihui Gao, Yang Li, Kui Li, Xiang Ji, Zhibin Liang
Language: English
Subfield: Automotive Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4416589388
