Work

Aging Mechanism Analysis for Series‐Connected Battery Pack Based on Open‐Circuit Voltage Reconstruction under Low Temperature

Year: 2025
Type: article
Authors: Wenhua Li, Tian Hu, Chunxiang Zhang, Jihui Gao, Yang Li, Kui Li, Xiang Ji, Zhibin Liang
Language: English
Open Access status: closed
OpenAlex ID: W4416589388
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Cites: 32
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