DyReCS-YOLO: A Dynamic Re-Parameterized Channel-Shuffle Network for Accurate X-Ray Tire Defect Detection
Year: 2025
Type: article
Abstract: Reliable detection of X-ray tire defects is essential for safety and quality assurance in manufacturing. However, low contrast and high noise make traditional methods unreliable. This paper presents DyReCS-YOLO, a dynamic re-parameterized channel-shuffle network based on YOLOv8. The model introduces a C2f_DyRepFusion module combining dynamic convolution and a shuffle-and-routing mechanism, enabling adaptive kernel adjustment and efficient cross-channel interaction. Experiments on an industrial X-ray tire dataset containing 8326 images across 58 defect categories demonstrate that DyReCS-YOLO achieves an [email protected] of 0.741 and [email protected]:0.95 of 0.505, representing improvements of 4.5 and 2.8 percentage points over YOLOv8-s, and 9.2 and 7.7 percentage points over YOLOv11-s, respectively. The precision increases from 0.698 (YOLOv8-s) and 0.668 (YOLOv11-s) to 0.739, while maintaining real-time inference at 189.5 FPS, meeting industrial online detection requirements. Ablation results confirm that the combination of dynamic convolution and channel shuffle improves small-defect perception and robustness. Moreover, DyReCS-YOLO achieves an [email protected] of 0.975 on the public MT defect dataset, verifying its strong cross-domain generalization.
Source: Electronics
Authors: Xinlong Bai, Quancheng Dong, Jinshuo Han, Youjie Zhou, Xu Qi, Longteng Tian
Institution: University of Jinan
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,896
OpenAlex ID: W4416594517