Radiation Effects in Silicon‐On‐Insulator n‐p‐n Double‐Gate TFET: A Simulation Study
Year: 2025
Type: article
Source: physica status solidi (a)
Authors: Jatismar Saha, Bijit Choudhuri, Rajesh Saha
Institution: National Institute Of Technology Silchar
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4416605134
