Modeling of random field deviation and assembled geometrical accuracy for large thin-walled structures
Year: 2025
Type: article
Authors: Chang Gao, Haidong Yu
Institution: Shanghai Jiao Tong University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G3520902893
OpenAlex ID: W4416670894