Solution-processed high- κ SrTiO 3 with high breakdown field for gate dielectrics
Year: 2025
Type: article
Source: Journal of Materials Chemistry C
DOI: 10.1039/d5tc03765d
Authors: Dinghao Ma, Zihao Chen, Haowei Li, Boxi Ye, Liting Liu, Han He, Shiwei Sun, Nanting Luo, Hao Huang, Daocheng Pan, Bingsuo Zou
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G5719146773, G6651904779, G906724973
OpenAlex ID: W4416673968
