Work

Non-destructuve 3D microstructure mapping for large samples with complex microstructure

Year: 2025

Type: article

Abstract: Scanning 3D x-ray diffraction is a non-destructive synchrotron technique for mapping the 3D microstructure of polycrystalline materials where a focused hard x-ray beam is scanned across the sample to obtain spatially-resolved microstructure information. We demonstrate a new approach to such an experiment which extends the capabilities of existing techniques to be able to handle more complex and highly deformed microstructures. We demonstrate this by mapping the formation of sub micro meter sized deformation twins in-situ and in the bulk at deformation levels up to 20% in an as-built additively manufactured steel sample.

Source: Materials Research Letters

DOI: 10.1080/21663831.2025.2591884

Authors: M. Carlsen, W. Hearn, A. Acharya, U. Lienert, S. Van Petegem, M. Liebi

Institutions: Paul Scherrer Institute, École Polytechnique Fédérale de Lausanne, Deutsches Elektronen-Synchrotron DESY

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: gold

Estimated APC paid: $1,459

Funders: Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung, European Research Council, Deutsches Elektronen-Synchrotron