EMU fault detection algorithm based on the GAN+YOLO model under limited data
Year: 2025
Type: article
Abstract: Electric multiple units (EMUs) fault detection under the Train-side EMU Fault Detection System (TEDS) faces persistent challenges due to data scarcity and frequent missed detections of small or cross-scale fault targets. This paper proposes a dual-enhanced detection framework that integrates high-fidelity data generation with a structurally optimized lightweight detector to address these issues. On the data side, we present DefectGAN-SLS, a style-transfer-based generation network incorporating a self-light suppression branch to reduce overexposure artifacts and preserve structural details. Compared with the original DefectGAN, this improvement lowers the Fréchet Inception Distance (FID) score from 96.33 to 92.98, yielding more realistic synthetic samples. When used for model training, the inclusion of synthetic data improves detection performance. The mAP50:95 increases from 0.459 (real data only) to 0.514 with DefectGAN, and further to 0.523 with DefectGAN-SLS, particularly benefiting low-sample fault categories. On the model side, we introduce EFD-YOLOv11n, an enhanced detector based on YOLOv11n. It includes a cross-scale detection head to fuse shallow high-resolution and deep semantic features, alongside a lightweight attention module that suppresses redundancy and emphasizes key regions. A coarse-to-fine feature aggregation structure is also incorporated to improve multi-scale representation, enhancing localization accuracy for small and dense targets while maintaining real-time efficiency. Experiments show that EFD-YOLOv11n improves mAP50:95 by 3.8% (from 0.504 to 0.523) with nearly unchanged parameters (from 2.6 M to 2.9 M) and moderately increased FLOPs (from 6.3 G to 11.3 G), while maintaining a high inference speed of 416 FPS. This demonstrates an excellent efficiency–accuracy trade-off, making EFD-YOLOv11n a lightweight and practical solution for real-world EMU fault detection.
DOI: 10.1093/tse/tdaf071
Authors: Ruixin Deng, Scarlett Liu, Yu Zeng
Institution: Central South University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $1,575
Award: G3650633192
OpenAlex ID: W4416794333
