Year: 2025
Type: article
Abstract: Electric-field noise near ion-trap electrodes limits motional coherence and represents a key obstacle to scaling trapped-ion quantum systems. Here, we investigate how in situ Ar+ sputtering modifies motional heating and dephasing in multi-material surface-electrode traps. Trapped ions serve as local probes of electric-field fluctuations before and after controlled sputtering cycles. The data reveal a non-monotonic dependence of both the dephasing rate and the electric-field noise on the extent of Ar+ sputtering, with coherence initially improving while heating rates increase, followed by a reversal at longer exposures. This behavior highlights the intricate balance between beneficial surface cleaning and detrimental structural modification, driven by changes in surface morphology, redeposition of sputtered material, and diffusion on the surface, underscoring the complex interplay between surface composition and motional stability in multi-material electrode systems. Post-treatment scanning electron microscopy and energy-dispersive X-ray spectroscopy confirm significant modification of the multilayer structure. Technical noise was independently verified to be well below the observed levels. These findings indicate that in situ sputtering modifies surface properties in ways that can either mitigate or enhance electric-field noise, underscoring the need for precise control of material interfaces in next-generation ion-trap architectures.
Source: Entropy
DOI: 10.3390/e27121208
Authors: Deviprasath Palani, Florian Hasse, Philip Kiefer, Frederick Böckling, Daniel L. Stick, Dustin Hite, Ulrich Warring, Tobias Schaetz
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $3,137
Awards: G2994577986, G8921241793
OpenAlex ID: W4416844626