Non-contact current reconstruction for fault detection in PCB circuits
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Wenyu Nie, Yongyi Tan, Haoyi Guo, Jinglin Ye, Huachun Wang, Wenxiao Fang
Institution: Sun Yat-sen University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4416859506
