Research on a tailored deep learning method-based information extraction model for engineering document in the advanced electronic industry
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Junhua Zhang, Jing Tao
Institution: Shanghai University
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4416859544
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