Chipless RFID sensor for metal crack monitoring
Year: 2025
Type: conference-paper
Source: IET conference proceedings.
Authors: Yingying Liu, Wenmei Zhang
Institution: Shanxi University
Language: English
Topic: RFID technology advancements
Subfield: Media Technology
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4416859562
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