Work

Full-field characterization of liquid crystal devices with geometrical correction for thick samples

Year: 2025

Type: article

Source: Optics Letters

DOI: 10.1364/ol.582615

Authors: T. Jankowski, M. Józwik, A. Pakuła, P. Morawiak, N. Bennis

Institutions: Military University of Technology in Warsaw, Warsaw University of Technology

Language: English

Topic: Liquid Crystal Research Advancements

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Politechnika Warszawska, Wojskowa Akademia Techniczna

Awards: G2118227753, G3681617365, G6165243109

OpenAlex ID: W4416871443

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Cites: 19

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